40 A / 30 A SiC isolated gate driver eval with slew-rate control, DESAT, ASC and BIST (ADuM4177)
← All reference designs · Vendor page: ADI EVAL-ADuM4177EBZ
| Hardware | unknown |
|---|---|
| Status | active |
| Application | traction |
| Semiconductors | SiC, IGBT |
| Key devices | ADuM4177 |
| Deliverables | schematic, layout, design-guide, gui |
| Target device | SiC-MOSFET, IGBT |
| Configuration | single |
| Driver ICs | ADuM4177 |
| Peak source (A) | 40 |
| Peak sink (A) | 30 |
| Protections | desat, miller-clamp, active-short, temp, slew-rate-control |
| Last verified | 2026-10-21 |
Notes
Why it is interesting: a driver-IC evaluation board rather than a system design, included because the ADuM4177 is representative of the new class of traction drivers. Turn-on slew rate is set over SPI and stored in EEPROM, and the IC has built-in self-tests for functional safety and an active short-circuit (ASC) input. 40 A source current lets it drive large traction modules directly without a booster stage.
Watch out: this is a lab board (jumpers, headers, dummy loads), not a layout to copy; the user guide says so itself. Isolation rating, CMTI and V_GS levels are not recorded here; fill them in from the ADuM4177 datasheet. The user-guide URL is assembled from ADI’s standard documentation path (link-unchecked).
Tags: spi-configurable · eeprom-settings · built-in-self-test · 0.38-ohm-output-stage · link-unchecked